Amptek is pleased to offer our improved line of silicon drift detectors (SDDs) for energy dispersive spectroscopy (EDS) use within scanning electron microscopes (SEMs). Using our proprietary “C-Series” silicon nitride (Si3N4) X-ray windows, the low-energy response of our FAST SDD ® extends down to beryllium (Be). The FAST SDD® with its high intrinsic efficiency is ideal for EDS, which is also known as energy dispersive X-ray spectroscopy (EDX or XEDS) and energy dispersive X-ray analysis (EDXA) or energy dispersive X-ray microanalysis (EDXMA).
All results on this page are typical performance values at full cooling; please Contact Us to discuss guaranteed performance under different operating conditions. Specifications subject to change without notice.