Amptek is pleased to offer our improved line of silicon drift detectors (SDDs) for energy dispersive spectroscopy (EDS) use within scanning electron microscopes (SEMs). Using our proprietary “C-Series” silicon nitride (Si3N4) X-ray windows, the low-energy response of our FAST SDD ® extends down to beryllium (Be). The FAST SDD® with its high intrinsic efficiency is ideal for EDS, which is also known as energy dispersive X-ray spectroscopy (EDX or XEDS) and energy dispersive X-ray analysis (EDXA) or energy dispersive X-ray microanalysis (EDXMA).

x-123sdd with c2 window for SEM EDS applications
Figure 1. The X-123 FAST SDD® spectrometer with C2 window, vacuum extender, and feedthrough coupling.


Figure 3. Beryllium (Be) and Carbon (C) spectrum with new Fast SDD® detector with C2 Window.

C2 Window Transmission Efficiency

ElementC2 Window
Transmission
Li29%
Be13%
B19.7%
C43.9%
N59.2%
O62%
F69%
Ne72.9%
Na75.1%
Mg77.3%
Al80.3%
Si81.8%

c series x-ray window
Figure 5. C2 Window vs. polymer window.

fastsdd_2
Figure 6. FAST SDD® 55Fe Spectrum.

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All results on this page are typical performance values at full cooling; please Contact Us to discuss guaranteed performance under different operating conditions.  Specifications subject to change without notice.