Amptek is pleased to offer our improved line of silicon drift detectors (SDDs) for energy dispersive spectroscopy (EDS) use within scanning electron microscopes (SEMs). Using our proprietary Patented “C-Series” silicon nitride (Si3N4) X-ray windows, the low-energy response of our FAST SDD® extends down to beryllium (Be). The FAST SDD® with its high intrinsic efficiency is ideal for EDS, which is also known as energy dispersive X-ray spectroscopy (EDX or XEDS) and energy dispersive X-ray analysis (EDXA) or energy dispersive X-ray microanalysis (EDXMA).
Figure 6. FAST SDD® 55Fe Spectrum.
All results on this page are typical performance values at full cooling; please Contact Us to discuss guaranteed performance under different operating conditions. Specifications subject to change without notice. The C2 window is NOT He tight. Do not put it in He purge. It will destroy the vacuum and void warranty.